Used JEOL JSM 6335F #293744948 for sale

JEOL JSM 6335F is a scanning electron microscope (SEM) that is designed for a variety of analytical imaging and spectroscopy purposes in various disciplines, such as materials science, environmental analysis, forensic science, semiconductor and electronic device analysis, and biological applications. JSM 6335F features a field-emission gun containing a tungsten filament which can be operated at three different accelerating voltages: 0.2 kV, 1.0 kV, and 15.0 kV. The high power electron optics provide excellent resolution and high contrast at a very low beam energy. Additionally, the electric lens current controllers enable very precise manipulation and distortion corrections of the beam trajectories. The maximum scanning area of the 6335F is 30 x 30 mm. JEOL JSM 6335F offers a variety of imaging modes, such as secondary electron imaging (SEI), backscattered electron imaging (BEI), and X-ray spectroscopic imaging (XSI) using a high-speed energy dispersive X-ray (EDX) detector. The energy dispersive X-ray spectroscopy (EDS) equipment lets users identify elements, quickly analyze spatial distribution of elements, and even collect a wide range of spectra in large areas. This analytical SEM can also be equipped with various accessories, depending on the user's application. An Argus laser cathodoluminescence system is available for geo-referencing and stitching of large area images and can be used for imaging of non-conductive materials. A glow discharge unit is capable of generating up to 1.5 mA currents and is suitable for measurements of molecular weight and dynamic driving force of surface reaction on metals and semiconductors. This SEM is designed to address the demands of field emission technology. The low beam voltage helps reduce sample charging effects as well as minimize secondary electron generation. Long working distances, along with thermal electron suppression, allow even non-conductive materials to be imaged. A reduced-distortion detector machine helps account for movement of the stage to ensure a reliable, undistorted overview of the sample. JSM 6335F is a powerful SEM, providing users with high-resolution images of sample surfaces and elemental distributions. This instrument is an invaluable device for analyzing materials at the micro and nano-scale levels.