Used JEOL JSM 6360 #293704584 for sale

JEOL JSM 6360 is a scanning electron microscope (SEM) that is designed to provide high resolution imaging and measurement for various applications. The equipment utilizes an electron gun to scan the sample, producing an interactive image which can be rotated, enlarged, and manipulated according to the user's desires. The electron gun is capable of producing a 5-nanoamp beam with a diameter of 3 to 4.5nm, which allows for precise imaging at high magnifications. A 15mm sample chamber is used to house the sample, and the system additionally features variable pressure and low-vacuum capabilities to ensure optimal operation conditions. JSM 6360 also features a range of different analyses, including X-ray elemental composition, EDS (Energy-dispersive X-ray Spectroscopy) and secondary electron imaging (SEI). These analyses can be performed using various software packages, including EDAX's Genesis X-Ray Analysis Software, Bruker's X-Flash 5060 Analysis suite, and JEOL own ViewON Software. The unit also utilizes a high-sensitivity cold-field emission detector to produce the most detailed, vivid images. This detector captures images at a variety of angles, allowing for maximum flexibility in imaging capabilities. Additionally, the machine also comes equipped with an easy-to-use joystick, which can be used to focus the beam to further enhance the images. Furthermore, JEOL JSM 6360 is designed for ease of use, with a host of user friendly features including a removable sample holder, direct-access keypads for beam-control, and integrated hardware and software for carrying out additional analyses. Finally, JSM 6360 is highly reliable due to its superior construction and well-designed parts. Its auto-focus and alignment features ensure that images are accurate and properly aligned for maximum accuracy. In summary, this SEM is an excellent choice for high-resolution imaging and measurement of various samples.