Used JEOL JSM 6360LV #293799326 for sale

JEOL JSM 6360LV scanning electron microscope (SEM) is a powerful tool used for imaging and analysis in a variety of scientific fields. It features a Cold Field Emission Gun (CFEG), which provides high beam currents and a high level of beam stability. This SEM also has a low vacuum (LV) capability allowing samples to be seen at atmospheric tunneling pressure. JSM 6360LV produces a magnification range of up to 100,000x, with an acceleration voltage range from 3 kV up to 30 kV. With the correct settings, and a suitable sample stage, it is possible to obtain resolutions as low as 0.24nm. In addition to its imaging capabilities, a range of analytical techniques and detectors can be coupled with the SEM such as energy dispersive X-ray (EDX) spectroscopy and electron backscatter diffraction (EBSD). JEOL JSM 6360LV, equipped with EverHIGH Image-Systems, allows for real-time automated low-vacuum imaging and spectrometries. This system is able to provide the user with quick and accurate information, while avoiding sample damage caused by the electron beam. Furthermore, JSM 6360LV features an integrated 360-degree entrance aperture detector, allowing multi-directional electron analysis. This makes it much easier to view a wider range of specimens, such as samples with an irregular surface. Additionally, an automated specimen jig is available for the microscope, providing precision sample positioning during automated mapping and measurements. A large touch-screen control panel provides user-friendly access to the microscope settings, allowing users to easily setup the instrument for their needs. JEOL JSM 6360LV allows real-time data acquisition and digital archiving of data to a USB drive. The automated stage, together with the vacuum, digital image processing, and automated algorithms, can be triggered to take various measurements and analysis with the push of a button. Overall, JSM 6360LV scanning electron microscope provides many features, benefits, and advanced capabilities. The ability to obtain high-resolution images, coupled with analytical capabilities, makes this SEM an ideal tool for many applications.