Used JEOL JSM 6360LV #9373179 for sale

JEOL JSM 6300LV Scanning Electron Microscope (SEM) is a high resolution instrument designed for imaging, elemental analysis and x-ray microanalysis. This versatile SEM enables both low and high vacuum operation and features a unique low-voltage capability of 1 - 15 keV, which facilitates the observation of samples with minimal damage in the secondary and backscattered electrons (BSE) imaging modes. Instrument details include a 5 nm spot convergence angle, 25 kV Field Emission electron source, 20 W small spot diameter down to 0.3 μm, 5W Kβ x-ray source, three-axis X/Y/Z stage, 2.5 - 5 kW peak power and 15 keV operation. The JSM 6300LV provides high resolution imaging, elemental analysis and x-ray microanalysis of a wide variety of samples. Theoretical resolution is 0.8 nm for secondary electrons at overall magnification of 1000 times, enabling sub-micron imaging of various samples. This SEM also includes a detection system for simultaneous simultaneous imaging and spectroscopy, which promises rapid data acquisition. The electron detector enables both top and bottom imaging support and includes a 5 keV BSE detector for imaging of non-conductive specimens. Another electron detector mounted in the optical axis serves to improve back-scattered electron imaging by increasing the sensitivity of the detector from 5 keV to 15 keV. The SEM is also able to image very low current samples, including solids, liquids and even gaseous samples. The Field Emission Source also ensures stable and consistent repeatable performance. The advanced imaging system includes multi-monitoring capabilities. This enables the operators to switch between multiple imaging configurations, thereby enabling the investigation of a broader range of samples. JEOL JSM 6300LV has a large work area available for a wide range of sample sizes. It also offers an adjustable chamber shape, making it suitable to be used in a variety of working facilities and tasks. Furthermore, the instrument is equipped with a powerful navigation and image processing software, enabling complex analyses and report creation. The JSM 6300LV is a valuable tool to be used in various research fields such as semiconductor research, life science, environmental sciences, geosciences and materials sciences, just to name a few. With its wide range of features and low operation voltages, the JSM 6300LV is an ideal instrument for imaging, elemental analysis and x-ray microanalysis.