Used JEOL JSM 6360LV #9411234 for sale

JEOL JSM 6360LV is a variable pressure scanning electron microscope (VP-SEM) that combines high-quality imaging with a host of advanced analytical capabilities. This instrument is designed for advanced research, industrial and educational use in the electromagnetic field imaging laboratory. JSM 6360LV is able to operate in low vacuum (LP) and variable pressure (VP) modes. The switchable low pressure mode enables this instrument to image large particles, providing the highest level in imaging contrast. The variable pressure mode is suitable for imaging biological samples and observing their surface features in great detail. Through this mode, the instrument can capture a magnified view of a sample's surface in ten times the resolution of light microscopy. In addition to this high-resolution imaging capability, JEOL JSM 6360LV is equipped with advanced analytical features. These include Energy Dispersive X-ray Spectroscopy (EDX), which is used to determine the elemental composition of a sample, and Wavelength Dispersive X-ray Spectroscopy (WDX), which helps in identifying the structure and composition of molecular species. The instrument also has an additional electron detector for secondary electrons, which enables different types of imaging contrast and enables the imaging of the three-dimensional structures of certain samples. JSM 6360LV also has an auto-focusing with real-time auto-stigmatism feature, which maintains the focus position even when the sample is moved. The instrument is also able to store up to three preset imaging conditions, allowing for easy retrieval and efficient data analysis. By taking advantage of its advanced features, JEOL JSM 6360LV has a wide range of applications, from mechanical and chemical analysis to medical diagnostics and semiconductor packaging. This versatile instrument is therefore suitable for all types of materials science and research.