Used JEOL JSM 6360LV #9412081 for sale

JEOL JSM 6360LV is a scanning electron microscope (SEM) that is capable of producing high-resolution images with remarkable depth and detail. This is made possible by its 5nm resolution in the x-y direction, and its 0.5nm resolution in the z-direction, meaning it can accurately identify the size, shape, and orientation of features within a sample. The system is advantageous for a variety of applications, such as imaging live cells, surface analysis, and materials analysis. Additionally, the ultra-high vacuum environment of the system results in minimal sample drift during imaging, resulting in improved image sharpness over time. JSM 6360LV also incorporates an Energy Dispersive X-ray Spectrometer (EDS), which can be used for elemental analysis. As the SEM scans the sample, the EDS records energy spectra from the x-rays emitted from the sample, which can then be analyzed in order to determine the composition of the material being imaged. The system is also capable of tilt and sample rotation, allowing for viewing at a range of different angles and orientations. This means the sample can be imaged from several different perspectives, potentially providing insight that a single image would not be able to. Furthermore, the vertical stage design of JEOL JSM 6360LV allows for easy sample mounting and high-precision specimen alignment. This allows for quick and accurate placement of samples, making it easy to set up a scan and to get accurate results. Overall, JSM 6360LV is an advanced scanning electron microscope that provides excellent resolution, exceptional depth and detail, and flexible imaging capabilities. Whether it is used for imaging live cells, analyzing surfaces, or investigating materials, this SEM delivers on all fronts.