Used JEOL JSM 6380 #9086904 for sale

JEOL JSM 6380 is a scanning electron microscope that operates using a tungsten filament e-gun and has a spatial resolution of 0.25nm. It incorporates a double-tilt sample holder with up to 5 degrees of freedom and a wide range of detections. It is capable of two-dimensional imaging, energy-dispersive and wavelength-dispersive X-ray analyses, as well as element-specific imaging. The high-performance tungsten filament e-gun employed by JSM 6380 increases the spatial resolution to 0.25nm for maximum performance. This system also has a beam current of 200-300nA and working distances from 600mm to 1500mm. The adjustable accelerating voltage can also be set up to 30kV, allowing for a wide range of applications, including low voltage imaging. The innovative double-tilt sample holder is equipped with up to 5 degrees of freedom, including a practical sample loading and unloading system. This allows the user to shift the sample into the optimal position relative to the electron beam, improving image contrast and resolution. The double-tilt sample holder also allows for greater flexibility and safety in sample positioning for TEM or STEM applications. This holder is also compatible with a range of sample material, and either annealed or cold-modification stages can be used. JEOL JSM 6380 is capable of performing a wide range of detections, including analytic mapping, energy-dispersive and wavelength-dispersive X-ray analyses, and element-specific imaging. Analytic mapping can be employed for quantifying the elemental composition of the sample, while energy-dispersive X-ray analyses can be used to identify which elements are present in the analysis area. Wavelength-dispersive X-ray analyses can be used to determine the chemical properties of the sample, while element-specific imaging helps to decipher the atomic structure and composition of the sample. Overall, JSM 6380 is an advanced scanning electron microscope that offers a wide range of features. Its high-performance tungsten filament e-gun provides a resolution of 0.25nm, while its double-tilt sample holder allows for up to 5 degrees of freedom. It is also capable of carrying out a range of detections, as well as element-specific imaging, making it a great choice for materials research.