Used JEOL JSM 6380LA #293617188 for sale

JEOL JSM 6380LA scanning electron microscope (SEM) is a leading instrument that provides superior performance for microscopic research and analysis. It has been designed especially for material science, biology, and industrial applications, incorporating a unique high-resolution digital optical sensor and high-speed digital signal processor that allow for image interpretation at incredibly high levels of resolution and detail. JSM 6380LA uses a combination of sophisticated detection and signal processing technology to produce images with high magnification and contrast. It is equipped with a low-angle dark field detector, an annular dark field detector and a medium-angle dark field detector. The low-angle dark field detector allows for quicker and easier image acquisition, while the annular dark field detector and the medium-angle dark field detector allows for higher resolution images. JEOL JSM 6380LA also has a biprism column, which allows for observation of delicate or fine structures. The system is capable of operating in conventional or high vacuum modes so that researchers can perform both low and high vacuum studies. It has a scan range of 1-100kV, allowing for adjustment of any combination of pressure, accelerating voltage, and movement rate to obtain the highest levels of resolution. The digital optical sensor contains 8 megapixels, giving it the capability of acquiring detailed images of structures as small as one hundredth of a millimeter. This high level of image acquisition allows scientists to study cell organelles, microstructures and other miniature samples. The system also has a built-in digital signal processor, which allows for digital data storage and manipulation of analog signals into digital signals. JSM 6380LA includes further features to further enhance its image analysis capabilities. It includes three types of image display modes: bright field, backscatter and differential contrast, allowing for analysis of samples in a variety of conditions. The system also has a comprehensive set of software applications for user control, automation, and off-line analysis, providing researchers with multiple tools to achieve highly accurate and detailed imaging results. In summary, JEOL JSM 6380LA is a powerful scanning electron microscope that provides superb performance for scientific and industrial imaging applications. Combining high-end optical technology with image processing and manipulation capabilities, it is well suited for advanced analysis of microscopic and nano-scale samples.