Used JEOL JSM 6380LA #293671420 for sale

JEOL JSM 6380LA Scanning Electron Microscope (SEM) is a high-performance instrument designed for versatile imaging, as well as EDXA (Energy Dispersive X-ray Analysis) and WDS (Wavelength Dispersive Spectroscopy) elemental analysis. It offers high-resolution imaging and easy operation for a variety of sample applications. The variable pressure operation of the equipment allows for studying a wide range of samples without the need for an auxiliary pumping system while giving high- contrast images. The SEM features a digital 6.4 inch imaging unit using a variable magnification and image rotation. It offers a magnification range from 11x up to 500,000x with an enhanced depth of field and superior image contrast. The 8 kV (kilovolt) field emission gun (FEG) provides greatly increased brightness and resolution capabilities compared to the conventional tungsten guns while having wider dynamic range of secondary electron images for analyzing nonconductive samples. It is also equipped with a light detector screen that allows quick and easy imaging of samples with very low and even zero surface conductivity. The EDXA and WDS systems are an integrated part of the instrument and provide rapid and accurate chemical composition determination of the samples. The incorporation of both quad- Type SDD (Silicon Drift Detector) and inclined-type EDXA (Energy Dispersive X-ray Analysis) gives greater accuracy and reliability in analysis. The WDS provides elemental analysis from C to U (Cobalt to Uranium) for light elements. Multi-element analysis up to 36 elements with a separated window can be achieved with the SEM machine. JSM 6380LA offers a comprehensive imaging tool with powerful capabilities and is built for high accuracy and reliability. It offers a wide range of applications for users conducting a high-resolution imaging or elemental analysis. The SEM is ideal for expanding research activities.