Used JEOL JSM 6390 #293661432 for sale

JEOL JSM 6390 is a high-performance scanning electron microscope designed for imaging and analytical applications. It uses a combination of high-resolution secondary electron (SE) and back scattered electron (BSE) detectors to provide high-contrast images of samples. JSM 6390 also offers low-voltage SE imaging and a high-resolution back-scattered electron detector that can achieve a maximum resolution up to 5 nanometers. Its automated, computer-controlled operation allows for precise, repeatable imaging and analysis of a wide range of sample types. JEOL JSM 6390 employs an advanced UHR monochromatic electron gun that provides a superior signal-to-noise ratio and offers a wide range of accelerating voltages, between 1 kV to 30 kV. This allows the user to vary the degree of sample penetration and resolution, without sacrificing resolution. The high-performance secondary electron detector offers a range of imaging modes, including standard, differential and low-voltage SE imaging. The optional high-resolution BSE detector allows for both high-contrast BSE imaging and quantitative analysis. JSM 6390 also features an high-speed auto focus system that uses steam pressure for precise positioning of the sample and beam. This system combines with automated sample exchange installation, an integrated motorized xy-stage and a computerized electron microscope control system to provide improved accuracy, repeatability and productivity. To facilitate automated operation, JEOL JSM 6390 features a range of automation and analysis software packages. This includes remote control software, real-time image processing tools, and analysis software that can be used to perform defect analysis, particle analysis, image analysis and data manipulation. Additionally, other specialized hardware, such as automated cleaning systems and ion and gas guns, can be integrated for further control and data collection. Overall, JSM 6390 is a high-performance scanning electron microscope that is capable of providing excellent imaging and analysis capabilities. It is suitable for a wide range of applications, including failure analysis, metallography and nanoscale imaging. The advanced electron source, automated sample exchange, and a range of software and hardware packages makes JEOL JSM 6390 a powerful tool for detailed imaging and analysis.