Used JEOL JSM 6390 #293749131 for sale

JEOL JSM 6390 is a scanning electron microscope (SEM) designed for various applications, such as material analysis, surface imaging, and microstructure observation. This tool provides high-resolution imaging capabilities, with a resolution of up to 1 nm. JSM 6390 is equipped with an X-ray detector that is used for energy dispersive X-ray spectroscopy (EDS). This technology enables user to collect elemental data on specimens in order to determine their composition. In addition, the microscopeis also equipped with a secondary electrons detector, allowing user to obtain information related to specimen's topography. JEOL JSM 6390 is powered by a thermionic gun for electron emission. The gun is used to accelerate electrons and direct them onto the specimen. The SEM is fitted with an electromagnetic objective lens that focuses the beam onto the specimen. The sample is held in a special chamber, which is typically filled with inert gas, such as argon. The imaging system of JSM 6390 is equipped with a digital signal processor and image processor, which provides images of the highest quality, resolution, and contrast. The digital signal processor also enables user to acquire elemental compositional mapping and 3-D reconstructions from the acquired image data. JEOL JSM 6390 is able to magnify samples up to 500,000 times their actual size and is capable of acquiring images with a pixel size of up to 0.05 nm. Furthermore, the microscope's unique design enables user to manipulate specimen orientation and tilt in order to acquire more accurate images and results. This laboratory-grade instrument is also equipped with the latest safety systems, as well as features that ensure rigorous vibration control during operation. This makes JSM 6390 a reliable, robust, and accurate tool, which can be used for various analysis and imaging applications.