Used JEOL JSM 6390 #293754494 for sale

JEOL JSM 6390 is a scanning electron microscope (SEM) designed for high resolution imaging, analysis, and characterisation. It combines exceptional image quality with an expansive range of features, enabling researchers to produce full-colour multi-dimensional images with unparalleled detail. The microscope has 5 high-resolution electron detectors, offering superior image quality with a maximum resolution of 3nm. Along with a Versa 3D BrightField Concept Backscatter Detector, this ensures unbeatable depth of focus and 3D rendering of samples. JSM 6390 also utilises an atomic spectroscopy system for elemental analysis, allowing for the identification of chemical composition for enhanced sample confirmation and study. Its integrated chamber also includes a cryo stage, an ult-low vibration platform, plus an energy filter and energy dispersive X-ray detector. This combination of features grants unparalleled analysis of samples at ultra-low temperatures. The microscope has a power of 6,000V and a variable pressure chamber that enables imaging of samples up to 3 milligrams per square centimetre in size. The JSM's intuitive operation is facilitated by the RAPID program, an automatic process which reduces the time taken to capture high-definition images. An integrated control system also allows users to adjust settings without accessing the controls panel. This makes it ideal for everyday operation and for the efficient imaging of a variety of samples. JEOL JSM 6390 provides comprehensive solutions to the tasks of metallurgy, semiconductor imaging, image simulation and spectroscopy. The combination of optimized imaging components and automated processes ensure productivity and reliability at every step of the sample preparation process. This makes it an ideal instrument for a wide range of applications.