Used JEOL JSM 6390LA #293609260 for sale

JEOL JSM 6390LA is a scanning electron microscope (SEM) designed specifically for use in semiconductor failure analysis and process control applications. It is a variable pressure scanning electron microscope (VP-SEM) offering superior imaging capabilities over traditional SEMs. The VP-SEM electron column allows for a wide range of operating conditions, which results in higher probing depth and cleaner images without sample charging. The base equipment is equipped with a cold-FEG gun and field-emission electron source, providing excellent coherence properties and beam stability. The gun is designed with a dual-lens optics system which enhances brightness and resolution of the resulting images. An auto-tuning electron column allows for simple operation and user-defined techniques for optimal results. With a high-resolution low-vacuum SE detector integrated in the column, JSM 6390LA can achieve improved resolution levels of 1.3 nm and a detection limit of up to 10 keV range. The integrated resolution calibration unit provides a reliable and precise means to analyse samples down to the nanometer level. Additionally, the microscope includes an advanced BackScatter Electron Detector (BSE) and a Secondary Electron Detector (SE) to further enhance imaging capabilities. In terms of operation, JEOL JSM 6390LA provides an easy to use user interface and optional automated or hands-on control over all functions. The SEM can be operated manually, or powered on and off using the built in power button. Other useful features include a navigator, video monitor and an illuminated reticle to guide the user during alignment and calibration. For increased safety and security, JSM 6390LA also offers a variety of user protection measures such as anti-electromagnetic interference, electromagnetic shielding and anti-static coatings. In addition, the machine includes both internal and external beam blanking imaging capabilities that prevent damage to samples from electron irradiation. Overall, JEOL JSM 6390LA is a world-class scanning electron microscope that offers outstanding image quality, resolution and detection capabilities for semiconductor failure analysis and process control. With easy to use controls, excellent optimization functions and advanced safety and security measures, JSM 6390LA is an ideal choice for those seeking to leverage the many benefits of the SEM technology.