Used JEOL JSM 6390LA #293633147 for sale

JEOL JSM 6390LA is a scanning electron microscope (SEM) designed for a range of applications in a variety of fields, including materials science, life science, and nanotechnology. It features an advanced secondary electron (SE) detector and an ultra-stable scanning electron column, allowing for improved resolution and contrast of imaging. The SE detector is equipped with a dedicated energy filter, providing excellent detection sensitivity and low noise. This makes it possible to observe delicate specimens or samples with low contrast. JSM 6390LA has a robust and versatile design. It is capable of working with a wide range of sample preparation techniques, including high-resolution imaging, backside imaging, low vacuum and high vacuum imaging, large area mapping, and high vacuum deposition. For additional flexibility and convenience, it is equipped with an automated sample transfer equipment and an automated sample stage. The system is equipped with a long working distance objective lens, providing a large depth of field for imaging a broad range of specimens and samples of different sizes and shapes. Additionally, JEOL JSM 6390LA features a variable spot size and magnification range, giving users more control over imaging techniques. The user-friendly operating unit further enhances the microscope's performance. The user has access to a wide range of automated operating and image-capturing functions, including a simple one-click operation to switch between working and imaging modes. The intuitive graphical user interface includes a spectrum of controls that allow users to manipulate image contrast and brightness, enabling them to adjust the microscope's performance to their needs. In terms of safety, JSM 6390LA is equipped with an emergency shut-down machine that protects both the operator and the equipment in case of emergencies. The safety tool is designed for reliable operation and long-term durability, making the microscope ideal for use in medical and industrial fields. Overall, JEOL JSM 6390LA is a highly versatile and advanced scanning electron microscope that offers excellent imaging performance and resolution. It is a great choice for a range of applications in a variety of fields, offering superior quality and reliability.