Used JEOL JSM 6390LA #9402534 for sale

JEOL JSM 6390LA is a cutting-edge scanning electron microscope (SEM) widely used in the scientific community. Its capabilities ensure maximum flexibility in research and operation, making it ideal for a variety of applications, including material characterization, failure analysis, and nanotechnology. JSM 6390LA is a field-emission SEM, meaning that it utilizes thermal field emission of electrons and an ultra-low vacuum interface to improve resolution and attain higher performance. Its gun module consists of a cold field emission gun, an in-lens detector, and an in-lens secondary electron detector, with the option for other detectors depending on the application. The electron gun features a wide range of power supplies and X-ray sources, providing the flexibility to utilize a variety of electron and X-ray beams. This scanning electron microscope is equipped with an array of analytical systems, including EDS, EELS and CL systems. Depending on the application, users can select one of the three different automatic stage systems: manual, auto-loading/unloading, or auto-stacking/unstacking. These features allow for quick and efficient sample utilization. JEOL JSM 6390LA offers a high level of image clarity and resolution, obtaining images at the nanometer-level. A motorized zooming capability allows for the magnification up to 5200x, and its high-speed semiconductor device with 512 x 512 pixels enables faster sampling times. JSM 6390LA is an efficient and powerful SEM suited for a wide range of tasks. Its modular design and advanced analytical systems make it a valuable tool in many areas of research, allowing users to achieve their research goals.