Used JEOL JSM 6390LV #293637307 for sale

JEOL JSM 6390LV Scanning Electron Microscope (SEM) is a powerful and versatile research tool for the study of microscopic structures and surfaces. This high-resolution SEM has a fine spatial resolution of 1 nm at an accelerating voltage of 1 kV, and a lateral resolution of 0.5 nm at 15 kV. It also has a large field of view (FOV) of up to 30 mm, and the ability to image over a sample area of up to 1000 cm2. JSM 6390LV uses an electron beam to generate images of a sample's cross-sectional morphology. This beam is formed through the lens system, which is made up of two condenser lenses and one objective lens. The condenser lenses focus the beam onto the sample, and the objective lens is used to collect the back-scattered or secondary electrons generated by the primary electron beam. These electrons are then detected and converted into digital signals. JEOL JSM 6390LV can operate with a vacuum chamber pressure range from 2 x 10-4 to 5 x 10-7 Torr. This pressure range allows for both high-resolution and high-sensitivity imaging. The high-speed image acquisition feature of this microscope allows for the acquisition of multiple images in less than one second. This microscope can be used for a wide variety of applications, including measuring surface roughness and topography, studying material properties, and analyzing elemental composition and distribution. It can also be used to analyze grain boundaries, porosity, and defects in a sample. The high-resolution imaging capabilities of JSM 6390LV make it an ideal tool for research in the fields of nanotechnology, material science, and biological sciences. With its intuitive user interface and advanced imaging capabilities, it can be used in both industrial and academic environments. With the right accessories, JEOL JSM 6390LV can even be used in high-speed application such as failure analysis and defect scanning.