Used JEOL JSM 6390LV #293647290 for sale
URL successfully copied!
Tap to zoom
ID: 293647290
Vintage: 2006
Scanning Electron Microscope (SEM)
GATAN Alto 2100 Cryo chamber
Resolution: 3.0µm at 30kV and 15µm at 1kV
Accelerating voltage range: 0.5kV-30kV
Magnification range: 5x - 300,00x
Imaging modes:
Secondary Electron (SE)
Back Scattered Electron (BSE)
Specimen size: 150mm x 45mm
Specimen stage: Eucentric stage axis motorization
Automated filament heating and alignment
2006 vintage.
JEOL JSM 6390LV is a scanning electron microscope (SEM) designed for a range of challenging applications from materials characterization to imaging a variety of samples. It is the latest generation of our LV series, combining groundbreaking innovations with advanced imaging and analytical capabilities. JSM 6390LV uses a high-resolution imaging system augmented with a range of features, allowing users to explore samples with superb clarity. Additionally, its updated Digital Peltier stage allows users to scan samples at temperatures ranging from -50ºC to + 500ºC; allowing further examination of samples that have intricate nanometric features in even the most extreme conditions. For peak resolution and accuracy, JEOL JSM 6390LV employs a variable beam voltage of 0.5-30kV and an acceleration voltage of 0.5-30kV. This allows for an effective range of magnification from x1,000 to x 400,000, giving users an in-depth look into the structure of their sample. This also enables an impressive minimization of drift, unaffected by environmental factors such as vibration, to ensure reliable and repeatable results. JSM 6390LV also consists of two parallel detectors; a secondary electron detector (SED) and a backscatter electron detector (BSD). Through the use of these proprietary detectors, users can obtain various levels of information about their sample. Angled extraction allows for improved surface detail through the SED, while the BSD gives greater insights into the sample's elemental composition using an array of analyzing modes. This model also features an integrated photomicroscope, allowing users to easily switch between the SEM and photomicroscope without disturbing their sample. This versatile tool is an invaluable asset, as it allows the user to conduct multiple experiments with one setup, saving precious time and resources. JEOL JSM 6390LV is the ideal instrument for any laboratory conducting surface analysis experiments. Its versatile capabilities, advanced features and user-friendly control make it a must-have for any surface inspection, defect analysis or materials characterization research laboratory.
There are no reviews yet