Used JEOL JSM 6390LV #293810359 for sale
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ID: 293810359
Scanning Electron Microscope (SEM)
Resolution:
HV mode 3.0 nm (30kV), 15 nm (1kV)
LV mode 4.0 nm (30kV)
Magnification:
x8 to x300,000 (at 11kV or higher)
x5 to x300,000 (at 10kV or lower)
Operations:
Optics
Specimen stage
Image mode
LV Pressure
Standard recipe
Image mode:
Secondary electron image
Composition
Topography
Shadowed
Objective lens:
3 Stages
X,Y Adjustable
Specimen stage:
Eucentric type
X: 80mm
Y: 40mm
Z: 5mm to 48mm,
Tilt: -10° to +90°
Rotation: 360°
Electron gun
Zoom condenser lens
Super conical objective lens
Stigmator memory
Electrical image shift ±50µm (WD=10 mm)
Motor control: 2 Axes, 3 Axes and 5 Axes
LCD Monitor, 15"
Digital zoom
Dual magnification
Network: Ethernet
Fully automated pumping system
Switching vacuum mode
LV Pressure: 1 to 270 Pa
(2) JED-2300 EDS
Accelerating voltage 0.5 kV to 30 kV
IBM PC
Operating system: Windows XP.
JEOL JSM 6390LV is an advanced scanning electron microscope (SEM) designed for use in materials analysis and failure analysis. It is equipped with a field emission gun (FEG) to generate a fine-focused electron beam, which is used to scan a sample and produce an image. The microscope has a variety of features that allow the user to obtain high-resolution images, in addition to providing a range of options for specimen preparation and analysis. JSM 6390LV provides a large field of view and has a working capacity from 10nm up to 30µm. The FEG has a field curvature compensation feature, allowing for improved image resolution. The acceleration voltage can be adjusted from 0.9kV up to 30kV, providing a range of purposeful applications. The microscope also has an enhanced signal-to-noise ratio, ensuring excellent contrast and phase images. Additionally, JEOL JSM 6390LV is equipped with an energy filter, allowing for Wavelength Dispersive Spectroscopy (WDS) and energy dispersive spectroscopy (EDS). JSM 6390LV comes with a range of sample holders, including a tungsten-tipped, carbon-coated holder, a recessed sample holder, and an in-lens sample holder. The latter in particular, has a 6-axis motorized sample movement, which enables the user to accurately position the sample in the electron beam. The SEM is also equipped with a high-vacuum preparation and observation chamber, allowing for in situ secondary electron imaging. To aid user convenience, the modification stage, sample holders, and observation chamber can be all controlled from a single user-friendly, multilingual touchscreen. Furthermore, all the microscope data, including images and stored information, can be accessed and visualized remotely over a network, allowing for collaboration between users. To summarize, JEOL JSM 6390LV is a highly capable SEM that offers high-resolution imaging with a broad range of applications. It also provides a number of features that enhance user convenience, such as a remotely-controlled touchscreen interface, making it an ideal tool for materials and failure analysis.
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