Used JEOL JSM 6390LV #9103749 for sale

JEOL JSM 6390LV is a scanning electron microscope designed for low voltage operations. It is equipped with an inverted column which makes it highly suitable for advanced research as well as educational use. This microscope utilizes a variable accelerating voltage of 0 to 30 kV with a maximum resolution of 3.2 nanometers and a magnification of up to 200,000X. JSM 6390LV is complimented by JEOL ESPe detector which can be utilized for a range of imaging techniques such as Automatic Retarding, SEAD, EDX, and WDS. This microscope also conveniently comes with a compact Optic/Shutter Unit, making it easy to maneuver and place on or near the sample, allowing for unobstructed observation. JEOL JSM 6390LV further boasts an efficient cold field-emission gun which will allow for longer operation times due to its low power consumption. The software that comes with this microscope is CES 2.1, and it provides full control of column parameters, along with excellent stability data. This software can be used to monitor the sample environment via the digital image processor and monitor the vacuum status or the emission current of the electron gun. It can also be used to save data and images, or even process them with the post-Processor. JSM 6390LV also offers ultimate sample handling capabilities with its automated 6-axis sample stage. The stage provides 360° rotation of the sample in all three planes, as well as precision sample placement with nanometer accuracy. This allows for responsive and stress-free sample orientation and manipulation, along with a quick setup time of loaded samples. Overall, JEOL JSM 6390LV is an excellent choice for advanced research and educational purposes alike, with its low power consumption, high resolution, flexible software and exceptional sample handling capabilities.