Used JEOL JSM 6390LV #9193088 for sale
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ID: 9193088
Scanning electron microscope
Specifications:
Resolution:
HV Mode: 3.0 nm (30kV), 15 nm (1kV)
LV Mode: 4.0 nm (30kV)
Magnification:
8x to 300,000x (at 11kV or higher)
5x to 300,000x (at 10kV or lower)
User operation recipe:
Optics
Specimen stage
Image mode
LV Pressure
Standard recipe
Image mode:
Secondary electron image
Composition
Topography
Shadowed
Accelerating voltage: 0.5 kV to 30 kV
Filament: Factory pre-centered filament
Electron gun:
Fully automated
Manual override
Auto functions:
Focus
Brightness
Contrast
Stigmator
Specimen stage:
Large eucentric type
X: 80mm
Y: 40mm
Z: 5mm to 48mm
Tilt: -10° to +90°
Rotation: 360°
Pumping system:
Fully automated
DP: 1
RP: 1 or 2
Switching vacuum mode: Less than 1 minute
LV Pressure: 1 to 270 Pa
JED-2300 EDS: Built in
Principal options:
Backscattered electron detector
Secondary electron detector for low vacuum
Wave length dispersive X-ray analyzer (WDS)
Specimen exchange airlock chamber
Chamber scope
Operation knobs
Specimen cooling unit
LaB6 electron gun
Report creation software (SMile View)
Operation console (750mm wide, 900mm wide, 1100mm wide)
Computer & peripherals:
HP Z230, CORE E3-1225v3 3.2GHz Processor with 4GB RAM
500GB SATA 1st HDD
16XDVD+/-RW SATA
USB Keyboard & optical mouse
ADAPTEC PCI SCSI 2940AU Host controller
Upgrade: Windows7 OS
19" Flat panel LCD monitor
EDAX EDS Not included
Power:
Single-phase, 100V AC, 50/60Hz
3.0kVA
Voltage regulation within ±10% (voltage drop at 3.0 kVA within 3%).
JEOL JSM 6390LV is a high-resolution scanning electron microscope (SEM) designed for imaging a wide range of materials and specimen widths. It combines a large vertical column with a unique world-class field emission gun (FEG) for high resolution imaging of samples down to a 0.4 nanometer resolution. The microscope contains a variety of features to help researchers make the most of their studies. Some of these features include: imaging modes such as backscattered electron (BSE) imaging, SEI (secondary electron imaging), SEVI (secondary electron variable intensity imaging), EDX (energy dispersive X-ray spectroscopy), WDS (wavelength dispersive X-ray spectroscopy), and EBSD (electron backscatter diffraction), back focal plane (BFP) imaging, and analytical electron microscopy (AEM). The microscope is equipped with a large 3-axis manipulator which allows users to quickly and precisely manipulate the specimen while under SEM imaging. It is also equipped with an automated XYZ 4-axis robotic specimen handler which allows researchers to automatically exchange samples and adjust their imaging positions. JSM 6390LV is also equipped with various environmental options such as low-vacuum cryo-SEM, cryo-SEM for low temperatures, and high-temperature SEM for up to 1000°C. Furthermore, diffracted backscatter ion-beam imaging (IBI) features a high spatial resolution of up to 2 nm. These features allow researchers to have a full range of high-resolution imaging capabilities for different application needs. Finally, the microscope includes the industry-leading Pure ChromView software that the user can control. This software enables convenient and comfortable operation of the microscope and allows users to acquire high resolution and video images within minutes. In conclusion, JEOL JSM 6390LV provides researchers with a reliable and powerful SEM system that offers a wide range of high-resolution imaging capabilities along with an array of automated features. This microscope can be used in a variety of studies, spanning from materials sciences and nanotechnology to industrial process control and biomedical applications.
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