Used JEOL JSM 6390LV #9402759 for sale

JEOL JSM 6390LV scanning electron microscope (SEM) is an advanced and reliable instrument designed to provide excellent imaging and analysis capabilities for a host of applications in a variety of industries. Equipped with formidable technology and a unique flexibility of movement, it allows for high resolution imaging and material characterizations for a wide range of applications in the materials and engineering sciences, biology and life sciences, earth sciences, semiconductor and microelectronics, and other related fields. JSM 6390LV features a powerful acceleration voltage of 1.0-30.0 kV and a maximum current of 10.0 µA. Additionally, it is fitted with a high resolution field emission gun (FEG) and a direct detection system mechanism that guarantees a superb scanning area and resolution. This advanced instrument is also built with an intuitive and ergonomic vertical stage tilt drive, conveniently allowing to adjust acceleration voltage and current in small increments, as well as two-axis manipulation of the sample. In addition, its high-resolution, digital imaging system and automated navigation option provide the user with an easy and productive way of obtaining reliable measurements. Furthermore, the integrated software offers access to a range of features including automated 3D imaging with ultra-high resolution. JEOL JSM 6390LV is equipped with additional technologies to increase the performance of specimen analysis: The standard peltier stage provides for convenient and precise automated heating, cooling and venting of specimens, while an energy filter is capable of removing low-energy electrons from the sample. It offers excellent natural contrast and backscatter imaging, along with the ability to capture extremely shallow surface topography. JSM 6390LV is also packed with powerful software for enhanced data acquisition and analysis capabilities. Its advanced GUI (graphical user interface) allows even novice users to quickly understand and operate the microscope. An optionalElectron Back-Scatter Diffraction (EBSD) analysis is also available, providing quick and easy crystallographic mapping of a specimen surface. JEOL JSM 6390LV is a powerful and reliable scanning electron microscope designed to meet the demands of current and future research and experimentation. With its cutting edge technology, ergonomically designed operating controls, and a wide range of optional accessories, it is well-suited for use in many industrial and research applications.