Used JEOL JSM 6400 #293753986 for sale

JEOL JSM 6400 is a scanning electron microscope (SEM) that provides high resolution imaging with a variety of features. This SEM is designed for use in research and materials science applications, allowing users to observe and analyze the surface features and structural properties of materials. JSM 6400 features three imaging modes: secondary electron imaging, backscattered electron imaging, and cathodoluminescence imaging. In Secondary Electron Imaging (SEI), a beam of electrons is focused onto the sample surface and the secondary electrons which are emitted from the sample are collected and used to form an image. In Backscattered Electron Imaging (BSEI), the same beam is deflected off the sample surface and the backscattered electrons which are emitted from sample are collected and used to form an image. Cathodoluminescence Imaging (CLI) uses a narrower beam of electrons that is focused on the sample surface to excite fluorescent emission which is then collected to form an image. JEOL JSM 6400 is a highly sensitive system, allowing it to detect both subtle and major structural features down to the nanometer scale. With its large field of view, the device can image a wide range of samples including biological and geological materials. The integrated extractor ensures extremely low vacuum levels while the special electron column architecture ensures accurate beam positioning for superb image quality. This SEM also features advanced navigation controls including autopilot and navigator functions. These functions allow operators to easily move between areas of interest and adjust parameters such as focus or working distance and magnification. It's also possible to perform a variety of EDX experiments on JSM 6400. A high-end EDX system is available for the device with a built-in windowless detector, allowing users to perform energy dispersive spectroscopy (EDS) experiments. JEOL JSM 6400 also comes with an auto sample changer, allowing it to handle multiple samples without manual intervention. This feature helps to reduce the cost of experiments as only one instrument is needed. This SEM also comes with a range of other useful features such as automatic stigmator, automatic sample alignment, an adjustable field of view, an auto-stabilizer, as well as various imaging modes.