Used JEOL JSM 6400 #293763923 for sale

JEOL JSM 6400 scanning electron microscope (SEM) is a versatile analytical tool that allows researchers to study the nanostructure, chemistry, and electronic properties of materials. This high-end, multi-purpose instrument is designed to produce high-resolution images and data with both simplicity and accuracy. JSM 6400 features an electron gun equipment with four guns, including a high-efficiency, dimension-controlled field emission gun, a cold-cathode gun, and two thermally-assisted guns. This system is designed to provide the high-resolution imaging capabilities and the broad dynamic range necessary to accurately characterise the Nanoscale structural details of a variety of materials. To further enhance the capabilities of the EDX analysis unit for JEOL JSM 6400, the X-MAXN silicon drift detector (SDD) option is available. This detector provides high energy resolution, along with an improved signal-to-noise ratio for detecting small differences between light elements in thin samples. The SDD offers an advantage over other energy-dispersive X-ray (EDX) detectors, since it offers an increased count rate and shorter counting time. In addition to the imaging capabilities provided by the electron gun machine and EDX detector, JSM 6400 also features an off-axis infrared (IR) imaging detector. This detector allows researchers to image and analyze samples that contain small amounts of organic material, such as biomolecules, as well as other features that may not be visible to a standard SEM. To provide increased flexibility and functionality, JEOL JSM 6400 is equipped with a wide range of computer-controlled features. The instrument is able to connection with a variety of accessories and automated features, such as an automated stage, automated image acquisitions and a multi-sample automounter. These features allow researchers to build up larger datasets with greater accuracy and speed. Overall, JSM 6400 is a highly versatile, advanced SEM for a wide range of materials analysis applications. It's high-performance electron gun tool, EDX detector, IR imaging detector, and various computer-controlled automated functions allow researchers to perform high-resolution, accurate characterisation of a variety of sample types.