Used JEOL JSM 6400 #293776081 for sale

JEOL JSM 6400 is a scanning electron microscope (SEM) that is used to analyze samples at a very high resolution level. It utilizes secondary electrons, backscattered electrons, and certain x-ray spectra to allow for a detailed three-dimensional image of the sample being studied. JSM 6400 is capable of magnifying objects up to x30,000 and is often used to study biological specimens, for which high magnifications and rapid imaging capabilities are both desirable. JEOL JSM 6400 uses a unique vacuum system to enclose the sample and reduce the electric field strength. This allows the microscope to detect and analyze sample data with unprecedented accuracy. It is equipped with many advanced features, including an adjustable sample stage, an automated scan, and an in-lens detector designed to provide maximum resolution and clarity. JSM 6400 is equipped with sensitive detectors, which allows it to detect samples at a much higher resolution than traditional SEMs. It can capture details down to the nanometer scale. It also offers powerful analytical capabilities, capable of detecting element composition and structure, as well as revealing the presence of any impurities or flaws. JEOL JSM 6400 offers a range of sample preparation and imaging techniques. It offers both automated and manual sample preparation, as well as a range of modes for imaging and analysis. Scanning modes include bright and dark field, secondary electron imaging and compositional elements analysis, as well as backscatter electron imaging. JSM 6400 is an excellent choice for researchers looking for a powerful and reliable SEM. Its high resolution and powerful analytical capabilities make it an ideal tool for both routine and specialized research purposes. Its versatile range of preparation and imaging techniques allows for a wide range of applications and makes it an invaluable tool for any laboratory.