Used JEOL JSM 6400 #9075095 for sale

JEOL JSM 6400 scanning electron microscope (SEM) is a powerful and versatile analytical instrument capable of producing high-resolution images of both organic and inorganic materials. The instrument provides a wide array of features and functions with unparalleled ease of use. The advanced electron optics of JSM 6400 allow users to image sample surfaces at resolutions on the order of less than one-thousandth of a millimetre. This provides detailed topographical maps of highly complex 3D structures that can be used for a wide range of applications, from studying surface properties to performing automated point-to-point measurements. The analytical power of JEOL JSM 6400 is especially well suited for the analysis of materials such as insulators, semiconductors, packaging materials, PCBs, and MEMS components. The instrument is capable of imaging with a selection of electron energy and accelerating potentials, making it ideal for a variety of domains, from failure analysis and quality control to materials science research. For imaging biological samples, the instrument is equipped with a variable pressure (VP) or low vacuum chamber, allowing for improved imaging of non-conductive samples such as proteins and other organic compounds. In addition, an array of detectors are available for the collection of backscattered electrons (BSE), secondary electrons (SE), X-rays (EDAX), and cathodoluminescence (CL), making JSM 6400 a powerful material characterization tool. In addition to imaging, the instrument is capable of automated point-to-point measurements, allowing for simultaneous scanning and data acquisition. This specific function can be used for a range of analytical applications, such as analysis of sample surface roughness, surface area/volume profiles, determination of polarity/charge distribution, and grain size / shape analysis. Overall, JEOL JSM 6400 offers a wide array of advanced features and functions, making it the ideal choice for a variety of research and analysis applications. With reliable performance, intuitive operation, and a comprehensive range of analytical options, JSM 6400 provides researchers with an invaluable tool for studying even the most complex of materials.