Used JEOL JSM 6400 #9079566 for sale

JEOL JSM 6400 is a scanning electron microscope with cutting edge technology, designed to provide maximum clarity and precision in microscopy imaging. It is efficient in finding and examining surface topography, composition, and even providing three-dimensional information. It offers an unparalleled resolution and depth of field in the range of 1nm in elemental and package analysis, as well as for non-destructive analysis of semiconductor devices. Additionally, it can detect a wide range of materials at a high speed and accuracy. JSM 6400 has several features which enable superior imaging capabilities and accuracy. Its advanced combination of one secondary electron detector and three auxiliary detectors provide it with high-precision analysis functions. Its large chamber size and increased magnification range offer unparalleled depth of focus and resolution. Its chamber is able to withstand various temperatures to enable the study of materials under specific thermodynamic conditions. JEOL JSM 6400 is suitable for various application fields such as material science, life science, semiconductor manufacturing, metallurgy, and thin film analysis. Its flexibility is also suitable for both STEM and SAM imaging. Due to its advanced capabilities, JSM 6400 is capable of providing data on surface topography, composition, chemical bonding as well as three-dimensional analysis. In conclusion, JEOL JSM 6400 is a leading scanning electron microscope designed to provide crystal clear imaging and precision analysis of materials. Its range of features and its ability to perform at various temperature conditions make it a suitable research tool for a variety of industries. It is one of the most accurate and reliable microscopes for imaging and data acquisition.