Used JEOL JSM 6400 #9171178 for sale

JEOL JSM 6400 is a high-performance scanning electron microscope (SEM). It is designed for a wide range of scientific and industrial applications. The instrument's unique design includes a twin column upright column structure with low stray magnetic fields and a powerful electrostatic beam blocking system. This allows for a higher level of imaging quality and accuracy. JSM 6400 is equipped with a Schottky Field Emission electron source, which provides high resolution imaging. The high stability of the instrument ensures that data collected is repeatable and reproducible. JEOL JSM 6400 is a variable pressure SEM, capable of imaging specimens from 1 Pa to 1 Torr. This allows researchers to observe samples without drying or condensing them. The instrument has a fast dynamic range, from microamperes to high volts, which enables the visualization of both simple and complex specimens. It also has an advanced chromatic vacuum system, which facilitates the easy adjustment of electron energies and prevents the spread of contamination. JSM 6400 is fast and reliable scanning electron microscope, with a high throughput. It features a 16:1 superior signal-noise ratio, and a two-channel BSE detector with up to 1024 x 1024 resolution. The instrument has a large secondary electron detection area, which enables improved image quality at higher magnifications. This gives researchers greater control over the imaging process, and facilitates the analysis of specimens. In terms of data acquisition, JEOL JSM 6400 has a wide range of options, including SE, BSE and GSE imaging. The instrument also has capability for automated stage scanning, which greatly simplifies image acquisition. The automated stage scanning also helps increase experiment efficiency and accuracy. Additionally, JSM 6400 offers both manual and computer-controlled image analysis, which provides researchers with a wide variety of post-imaging options. JEOL JSM 6400 is an advanced and versatile scanning electron microscope. It offers a range of features, including a chromatic vacuum system, a fast dynamic range, and automated stage scanning. These features, along with its two-channel BSE detector, enable researchers to accurately and reproducibly analyze specimens and obtain high-quality images.