Used JEOL JSM 6400 #9259735 for sale

JEOL JSM 6400 is an advanced scanning electron microscope (SEM) that is designed for high resolution imaging and analytical applications. It is specifically designed to meet the demands of the modern microscopist with innovative features and high standard performance. The microscope is fitted with a 3.3 nm point-to-point resolution which is capable of producing high resolution images with the EHT-2 detector. An airlock chamber on the microscope allows for the introduction of samples and for samples to be safely manipulated during imaging. This allows for sample manipulation during imaging, as well as sample transfer from the microscope to an attached cryoprobe. The crystallography option of JSM 6400 allows for the analysis of crystalline structures, and offers the ability to create 3D reconstructions of the entire crystal lattice. This allows for easier identification of crystalline phases, microstructures and defect distributions. JEOL JSM 6400 is also able to perform advanced transmission electron microscope (TEM) imaging. This advanced imaging technique can be used to further analyze nanoscale materials, nanofabrication, and chemical composition. It can be used to observe single atoms or molecules, which is important for understanding physical and chemical properties on the nanometer scale. JSM 6400 is a versatile tool for both imaging and analytical applications, with a range of features that allow it to be used for a variety of application requirements. Its advanced performance and capability, combined with its user-friendly operation, make it the perfect choice for any modern microscopist.