Used JEOL JSM 6400 #9355834 for sale

JEOL JSM 6400 is a sophisticated scanning electron microscope (SEM) designed for advanced imaging with superior resolution and detection of subtle features. The instrument offers equal performance for a wide variety of analytical tasks, including failure analysis, materials analysis, electronic device inspection, and imaging of biological specimens. JSM 6400 runs off of 200-400 volts of direct current (DC) high-vacuum electron gun, providing a high spatial resolution of less than 10nm at all magnifications and records fine details with a maximum magnification of 250,000X. The microscope is equipped with a digital imaging processor (DIP) to capture and save images quickly with equal resolution. The manual-lock gun tilt feature offers a high level of flexibility, allowing for quick adjustment of the electron gun and sample start angles for optimal imaging. JEOL JSM 6400 has an energy dispersive x-ray spectrometer (EDS) which is useful for elemental and chemical composition analysis with non-destructive methods. This tool increases accuracy and sensitivity in analysis, enabling the instrument to accurately identify trace elements or composition. Additionally, the SEM is equipped with an in-lens secondary electron (ISE) detector which is used to detect, analyze, and quantify surface features. Moreover, JSM 6400 provides comprehensive, sophisticated control capabilities for scanning techniques. This includes the ability to customize scanning parameters, such as spot size, step size, line density, and accelerating voltage, in automated scanning. It also offers microanalysis capabilities including automated area mapping, spectral mapping, z-slice, long-line, and 2D/3D analysis. Overall, JEOL JSM 6400 provides superior resolution, maximum flexibility, and advanced analytical capabilities. This instrument benefits a broad array of industries, from failure analysis to materials science, by offering exceptional imaging results.