Used JEOL JSM 6400 #9382242 for sale

JEOL JSM 6400 is an advanced scanning electron microscope (SEM). The microscope is equipped with an imaging system that combines secondary and backscattered electrons, as well as optional reflected electrons, resulting in a range of analytical information from one specimen surface. This system is effective for imaging surface topography, form, composition, contamination, and other surface features. JSM 6400 offers a range of resolutions up to 0.02 nm. This excellent resolution provides fine topographical information and allows for the imaging of nanoscale object features, such as nanoparticles or atomic structures. In addition, JEOL JSM 6400 offers a state-of-the-art energy dispersive spectrometer (EDS) for elemental analysis. By combining the information from the high resolution images with energy elemental analysis, users can identify not only the size of particles or features, but also the composition. JSM 6400 is equipped with a high stability power supply and high-precision stage control. This ensures accurate and repeatable settings, as well as highly reliable scanning. The high-vacuum condenser, sample chamber, and objective lens all contribute to increased optical and field depth of focus, offering sharper images and improved contrast even of small features. JEOL JSM 6400 is also equipped with an Energy-Filtering Transmission Electron Microscope (EFTEM) which filters out electrons that have been degraded due to multiple scattering events, allowing for a higher contrast image. It also features an array of detectors which provide different types of images and detection capabilities. These detectors include secondary electron detectors, backscatter electron detectors, reflected electron detectors, energy dispersive spectrometers, and analog power detectors. JSM 6400 also features a variety of automated operations, such as sample alignment and focus, grid mapping, and image control. It has a large chamber and is compatible with a wide range of sample holders, which make it highly suitable for a wide range of materials. This versatile tools make JEOL JSM 6400 an invaluable resource for research in surface science, nanotechnology, and material analysis.