Used JEOL JSM 6401F #9283953 for sale

JEOL JSM 6401F Scanning Electron Microscope (SEM) has a high performance 5.5 mm column that is optimized for fine specimen resolution. The advanced design of the alignment system allows for fast and accurate magnification adjustment, resulting in excellent resolution of fine detail. The stage motor used is smooth and precise, allowing for accurate specimen positioning. The SE detector adapts and optimizes the detector to the output of the electron gun, and the back-scattered electron detector allows for superior contrast imaging. JSM 6401F offers a variety of features, including automatic optimization of electron probe current and acceleration voltage, digital imaging, and a patented an electron beam blanker system for improved resolution. This allows for precise fine-tuning of the electron beam to minimize charging effects and improve sample clarity. The unit also includes a built-in post-foucault tilting system that provides 4 to 8 degree tilts in either direction for obtaining obliquely angled images. JEOL JSM 6401F also offers a variety of imaging modes, including back-scatter electron imaging; differential interference contrast; scanning electron microscopy; and secondary electron imaging. The secondary electron imaging mode produces high-resolution images of the specimen's surface and is particularly useful for obtaining information about surface topography, surface structure, surface chemistry, and surface structure-function relationships. In addition to imaging capabilities, JSM 6401F can also be used to analyze the specimen's composition. Its energy dispersive x-ray spectrometer (EDS analysis) is capable of detecting elements in a broad range of concentrations. The unit can also be used to carry out electron beam stimulation (EBS) of samples and can measure the specimen's electrical, magnetic, optical, and electronic properties. From a structural perspective, JEOL JSM 6401F is an all-in-one, compact unit that is both lightweight and easy to operate. The column and detector are integrated directly into the unit, and the objective lens is designed to move with minimal jitter, providing the highest level of performance and accuracy. In summary, JSM 6401F Scanning Electron Microscope is an advanced, highly versatile instrument that offers excellent resolution, a variety of imaging and analysis capabilities, and a robust structural design. With its impressive features and reliability, this SEM is an excellent choice for research and industrial applications.