Used JEOL JSM 6401F #9288544 for sale

JEOL JSM 6401F
ID: 9288544
Scanning Electron Microscope (SEM).
JEOL JSM 6401F is a scanning electron microscope (SEM) that provides high accuracy images and features to help users in the fields of material science, biology, and semiconductor engineering. This state-of-the-art instrument has a large working distance, a long stage travel range, and an extraordinary high resolution of 0.4nm at a working distance of 30mm. It achieves this resolution because of its field emission gun (FEG) electron source which utilizes an electron focused lens to create an extremely bright and highly-concentrated electron beam. This high electron beam brightness improves imaging contrast, image resolution, and ensures utmost accuracy. JSM 6401F allows users to make observations of 2D and 3D features through various modes, such as secondary electron imaging, reliable bright field imaging and auto-in-focus imaging. Additionally, high-angle annular dark field (HAADF) provides crystal structure analysis more powerful than conventional bright field imaging. Through the use of HAADF imaging users are able to accurately measure and quantify fine structures. The secondary electron transmission detector offers several options such as multi-stop, brightness and contrast, gamma, variable crossover, electron background, and image positioning. This diverse selection of functions helps bring out the minute details of almost any insect, mineral, or other object. Due to its versatile magnifications and wide range of working distances, JEOL JSM 6401F is ideal for both routine and high-end scientific microscopy applications. With a variety of electron gun settings, the instrument can also be used to observe objects that are particularly hard to image such as microelectronic components, polymers, metals and oxides, as well as cell organelles, live cells, tissue samples, and others. In short, JSM 6401F is a highly versatile and powerful scanning electron microscope with a sophisticated imaging technology that can be applied to various observations and environments. It is an excellent choice for anyone who needs finely detailed pictures and accurate measurements due to its excellent features, such as high resolution, high contrast, and wide application range.
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