Used JEOL JSM 6460LV #293648403 for sale

JEOL JSM 6460LV Scanning Electron Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis. It is used for a variety of research applications ranging from materials science to semiconductor technology. JEOL JSM-6460LV utilizes the latest electron detector technology to provide superior analytical performance with minimal noise and superb resolution. TheScanning Electron Microscope is capable of providing layered resolution of up to 0.5nm using both SE (secondary electron imaging) and BSE (backscattered electron imaging). JSM 6460LV utilizes an advanced imaging equipment consisting of an electron gun, condenser lens, objective lens, image intensifier and viewing system. The electron gun is used to generate electrons which are focused by the condenser lens and directed at the sample. The objective lens then focuses the secondary electrons and backscattered electrons onto the image intensifier tube. The image intensifier then amplifies and converts the signal into a visible image on the viewing unit. TheJSM 6460LV has a working distance range of 2-23 mm and a magnification range of 8 -30,000x. The user interface leaves nothing to be desired as it is equipped with a 10.4" color monitor, dedicated control unit and removable joystick. Furthermore, the machine is compatible with a variety of automated stages for motorized manipulation of the sample within the SEM chamber. TheJSM 6460LV is capable of high resolution imaging, analysis and mapping with a variety of sample holders including flat, three dimensional and biological carriers. With an energy dispersive X-ray detector, simple elemental and chemical analysis can also be conducted. Additional features of this robust tool include an integrated Ethernet connection and a Joyse EDS Software package. In conclusion, JSM-6460LV Scanning Electron Microscope is an advanced, high performance instrument capable of high-resolution imaging, analysis and mapping. Its easy-to-use interface, wide working distance range and powerful feature set make it an invaluable asset in any research environment.