Used JEOL JSM 6460LV #293762948 for sale

JEOL JSM 6460LV is an advanced scanning electron microscope that features electron beam technology. This is a versatile microscope which allows the researcher to conduct a variety of experiments including imaging, crystallography and atom probe analysis. The instrument employs a Schottky field emitting electron source (FEIS) that is able to generate a maximum beam current of 2.0 nA and an acceleration voltage of up to 150 kV. JEOL JSM-6460LV's electron optics employs a multiple lenses system with an electron optical column, which is able to image, detect and analyze electrons. The unique electron optics includes an in-lens detector system, which consists of a secondary electron detector, a backscatter electron detector, a wetted crystal detector, a field emission detector and an X-ray detector. By employing the various detectors, the researcher is able to obtain a range of different images, signals and spectra. JSM 6460LV also features a variety of sample stages, which provide excellent sample stability while under microscope. With the use of an inverted sample holder, JSM-6460LV is able to perform any low-temperature experiments that require cooling or heating. JEOL JSM 6460LV is equipped with a variety of features and instrument control software which allows the researcher to accurately control a wide range of experimental parameters and to obtain high quality images. The software incorporates electron beam current control, imaging processing, image analysis, and spectrometry processing capabilities. JEOL JSM-6460LV also provides a range of innovative sample preparation capabilities including Argon ion sputtering, argon cluster sputter deposition and carbon sputter deposition. Argon ion sputtering enables the researcher to create a thin layer of a metal or oxides to the sample surface, while the argon cluster sputter deposition and carbon sputter deposition capabilities allow for effective electrostatic coating of the sample surface. Overall, JSM 6460LV is a versatile scanning electron microscope that is equipped with cutting-edge electron optics and instrument control software, as well as additional features such as sample stages for enhanced stability, Argon ion sputtering and various coating capabilities. This makes it an ideal choice for researchers looking to image, detect and analyze a wide variety of samples.