Used JEOL JSM 6460LV #293764869 for sale

JEOL JSM 6460LV is a high-performance scanning electron microscope (SEM) designed for a wide variety of applications. This sophisticated instrument offers a full range of features and capabilities, including high-resolution imaging, depth profiling, X-ray mapping, and chemical-state imaging. JEOL JSM-6460LV employs a cold field-emission-gun (CEG) electron source, which allows for excellent image resolution under high vacuum and long working distances. The CEG source offers a lifetime of 10,000 hours, and features a resolution of 3 nm at 30 kV and 1.2 nm at 1 kV. Furthermore, it offers the highest magnification of up to 500 kx at a working distance of 10 mm. The instrument offers a variety of imaging modes, including bright field, dark field, differential interference contrast (DIC), polarization-analysis, and panchromatic imaging. It also offers electron backscatter diffraction (EBSD), which allows for the determination of the texture and orientation of materials with nanometer-scale resolution. Additionally, EBSD can be combined with X-ray mapping to analyze sample composition on the nanometer-scale. JSM 6460LV features a 'jog shuttle' stage, allowing for extremely precise and accurate sample positioning with repeatable accuracy. This is especially useful for applications such as depth profiling, allowing for the accurate investigation of two- and three-dimensional structures deep within the sample. The advanced analyzer system can be tailored to meet the user's specific needs; it offers a simultaneous use of up to five detectors, including an electron energy-loss system, an X-ray detector, a cathodoluminescence (CL) detector, a backscatter detector, and an analytical detector. A further two detectors can be added for specific applications such as angle-resolved X-ray analysis or hard X-ray or BSE imaging. Finally, JSM-6460LV also comes with comprehensive software, providing a user-friendly interface for all measurements and analysis. The software provides full control over imaging parameters, and features a range of image analysis and data modeling tools. This allows users to easily analyze, manipulate, and interpret data for increased accuracy and precision.