Used JEOL JSM 6460LV #9244467 for sale

JEOL JSM 6460LV scanning electron microscope (SEM) is one of the most advanced SEMs available. It is a high-performance instrument for imaging surfaces and controlling electron beam interactions. This equipment is ideal for applications requiring a high resolution with superior image quality. JEOL JSM-6460LV has a low-vacuum, low-vibration design for optimal imaging performance. It is equipped with a tungsten filament and a LaB6 thermo-field emission gun for maximum resolution and flexibility. The system also features a unique high-resolution filter for low-energy imaging, enabling it to capture fine details such as very small particles and defects. JSM 6460LV features a high-sensitivity, low-noise Everhart-Thornley detector for SEM imaging. It offers a superior dynamic range and fast response time, allowing for non-destructive imaging of surface structures. The detector also has a high quantum efficiency for maximum detection sensitivity. The 6460LV unit is designed with an automated focus machine for the greatest accuracy and precision when imaging. This tool also includes a secondary electron detector to acquire low-depth information about surface structures. Automatic centering and stigmation features make it easier to align the sample correctly. This SEM has a high-speed, large-area stage for rapid scanning of large samples. It is capable of scanning samples up to 30nm. The asset also has a scan speed of up to 5,000 frames per second for fast image acquisition. JSM-6460LV scanning electron microscope provides the highest level of imaging performance available in an SEM. Its low-vacuum, low-vibration design, Everhart-Thornley detector, and powerful features make this model ideal for detailed surface imaging. With its high resolution capabilities and automated functions, users can obtain high-quality imaging with the greatest accuracy.