Used JEOL JSM 6480LV #293597485 for sale

JEOL JSM 6480LV is a scanning electron microscope (SEM) that is capable of analysing a wide range of materials. It allows users to observe the detailed morphological and elemental information of the specimen being examined. JSM 6480LV is equipped with an Everhart-Thornley SE detector for secondary electron imaging and a one-touch type SEED for BSE imaging. It is capable of both regular SE and BE imaging, as well as producing secondary electron backscatter images. Furthermore, JEOL JSM 6480LV can also produce backscatter electron spectra and conduct line-scans for element mapping. The sample chamber of JSM 6480LV is capable of achieving a maximum sample size of 150mm (5.9 inches) in diameter and 250mm (10.0 inches) in height, with sample support stages having an adjustable X-Y range of 50mm (1.97 inches). The stage is constructed from a highly durable alloy, making it corrosion and scratch resistant. In addition to the standard SEM imaging mode, JEOL JSM 6480LV is capable of producing images with high resolution with the help of its high-resolution variable-pressure SEM (VP-SEM) feature. This feature works by reducing the pressure in the sample chamber, helping to improve the contrast and sharpness of details in the resulting images. JSM 6480LV is fitted with an Everhart-Thornley SE detector for secondary electron imaging and a single-scan controller for BSE imaging. It is possible to produce backscatter electron spectra and conduct line-scans for element mapping. By incorporating a 5-axis aperture, JEOL JSM 6480LV also offers advanced imaging capabilities and high-speed imaging with up to 8x multi-frame scanning. Also included with JSM 6480LV is a signal processor that allows users to adjust the detector signals to counter the charge-up effect and to optimize the signal dynamic range and picture clarity. This SEM model also comes with an autofocus function and digital zoom to enable rapid change of focus. JEOL JSM 6480LV is a highly versatile SEM system that was designed to allow users to explore the details of their specimens with precision and accuracy. With its high resolution imaging, variety of imaging techniques and additional features, it has the potential to provide valuable insights into the structure of materials and support the development of new materials.