Used JEOL JSM 6480LV #9285443 for sale

JEOL JSM 6480LV Scanning Electron Microscope (SEM) is an advanced analytical instrument used for mapping and analyzing dielectric and metal surfaces. JSM 6480LV offers a high-resolution secondary electron imaging capability, allowing for superior image quality with exceptional depth of field and improved signal-to-noise ratio. JEOL JSM 6480LV features a large working distance between the specimen and detector and a large field of view, providing a greater level of detail. The AE detector configuration, with standard image resolution of up to Everhart-Thornley imaging with up to 3.5nm lateral resolution and 5.2nm line per picture resolution, provides an imaging mode that allows for better visualization of small structures, surface features and interference patterns of samples. The system also includes a dedicated low-vacuum imaging technique allowing for specimen imaging with no sample preparation. This enables the capture of micron-scale physical features without having to perform sample preparation treatments before and during analysis. JSM 6480LV is designed to provide a comprehensive array of analytical analysis techniques including back-scattered electron imaging, chemical mapping, energy-dispersive x-ray spectroscopy (EDS), X-Ray fluorescence (XRF), and scanning auger microanalysis (SAM). These techniques provide microstructural analysis, chemical composition identification, and elemental mapping with high precision. JEOL JSM 6480LV includes an Auto-Sampler that allows samples to be scarred and placed in the chamber for automated analysis without the need for manual sample placement. The high-energy-resolution ion beam source ensures highly detailed chemical imaging and analysis. JSM 6480LV is equipped with an automated specimen stage allowing for continuous scanning and imaging of large samples without the need for manual adjustments or sample re-positioning. The system has a computer-controlled ultra-high vacuum (UHV) chamber for sample mounting, ensuring the integrity of the surface before and during analysis. JEOL JSM 6480LV is an invaluable tool for studying the physical and chemical properties of materials for a range of applications such as microfabrication process optimization, photovoltaics/solar cells, nanomaterials/nanoelectronics, and failure analysis. The high-resolution capabilities enable precise imaging and analysis of complex surface features. The system is reliable, robust, and offers convenience and flexibility, making it a versatile solution for advanced sample analysis.