Used JEOL JSM 6490LA #9285392 for sale

JEOL JSM 6490LA is a scanning electron microscope (SEM) that is widely used in a variety of fields, such as materials science, industrial inspection, and failure analysis. It utilizes highly advanced technologies to offer an incredible level of imaging resolution. JSM 6490LA is equipped with a unique high-performance scan generator, which has been specifically developed to produce brighter images with higher contrast quality. It is designed to support both tilt and rotation measurements, allowing users to capture three-dimensional images of high-precision samples with optimized performance. The SEM has a low vacuum performance system that offers 1.5 nm resolution and a detection system capable of detecting electrons with energies ranging from 1eV to 40 keV. This powerful system enables users to produce images with resolution of up to 5nm. The microscope also employs two different sample interfaces to accommodate a variety of sample types and sizes. The first is an automated sample changer that can handle up to 20 different samples at once. The second is a manual sample holder, which allows the user to quickly and effectively position the sample in the chamber. JEOL JSM 6490LA is also designed with a replaceable micro-carbon vacuum source, allowing for extreme levels of vacuum. This greatly minimizes background noise in the images produced by the SEM. This feature has numerous applications, such as extending the life of the SEM and enabling the collection of topographical images. JSM 6490LA is an incredibly powerful tool for analysis and exploration, making it an ideal choice for a variety of laboratory applications. Its advanced technology and incredibly high levels of imaging resolution provide unparalleled images and data for experimentation and inspection. This makes it an excellent choice for those who require the highest levels of imaging accuracy in their work.