Used JEOL JSM 6500F #293604703 for sale

JEOL JSM 6500F is a high-resolution scanning electron microscope (SEM), designed for state-of-the-art imaging and analysis. Offering high resolution imaging and analytical capabilities, it can be used for a wide variety of material characterization applications, from materials research and failure analysis to semiconductor device analysis, process control and sample preparation. JEOL JSM-6500 F allows for observation of objects down to nanometer resolutions, with an automated sample changer for complete sample manipulation. The microscope is designed for ease of use, with automated functions, a joystick-controlled stage, and high-speed scanning. It is equipped with high performance optics, providing high-accuracy imaging and dynamic noise reduction features. The detector is optimized to match the full range of capabilities, allowing the user to obtain excellent contrast and resolution. JSM 6500F also comes with a full suite of analytical capabilities, including energy dispersive spectroscopy (EDS) and wavelength dispersive spectroscopy (WDS) for elemental analysis. Both of these techniques enable fast and reliable elemental mapping with high accuracy. JSM-6500 F can also be used for stage X-ray imaging and for automatic grain measurements, with the careful choice of beam energies and detection intelligence to ensure maximum accuracy and repeatability. JEOL JSM 6500F offers advanced control capabilities, such as automated control of microscope and detector functions, and an automated signal assist function to provide additional improvement of analysis results. The microscope also features advanced data acquisition and analysis capabilities, allowing the user to have complete control over the scan area, parameters, signals, and data collection. Through the combination of high resolution, automated features, and the wide range of analytical capabilities, JEOL JSM-6500 F is the perfect tool for a variety of research and laboratory needs.