Used JEOL JSM 6500F #293625725 for sale
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ID: 293625725
Scanning Electron Microscope (SEM)
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JEOL JSM 6500F is a high-power scanning electron microscope (SEM) used for academic and industrial imaging applications. It is a world-class instrument with a resolution of 1 nanometer and high-speed scanning capabilities. JEOL JSM-6500 F is powered by an electron optical column structure that includes an EC-CS type electron gun, which provides high-resolution SEM images, and a JEOL-patented aberration correctors which improves image quality, while also reducing radiation damage on imaging samples. JSM 6500F also comes with a supporting energy dispersive X-ray spectroscopy (XEDS) detector and a JEOL proprietary vacuum equipment. The XEDS detector offers a variety of elements and energies, enabling analyses of sample elements such as carbon and nitrogen. In combination with the vacuum system, JSM-6500 F safely maintains a high degree of vacuum throughout scanning and analysis. JEOL JSM 6500F has a large field of view, from 8 x 10 mm up to 40 x 40 mm, and can image both large and small samples. The combined electron optics and scanning unit enable JEOL JSM-6500 F to capture large-scale images at high resolutions, up to 1 nanometer. This combined machine can be used to measure and analyze the structure of nearly any material. Additionally, JSM 6500F is equipped with a digital image processing suite to enhance image clarity, access noise filters, and brightness and contrast for specialized imaging. For users performing specialized applications, JSM-6500 F can be outfitted with a variety of ancillary components. This includes an energy filtering tool to adjust the energy contained in the electron beam, a multi-modal Automatic Image Acquisition Asset (AIA) which can integrate multiple imaging modes, STEM and SEM detectors, and an automated sample stage to facilitate accurate sample placement. Overall, JEOL JSM 6500F is a powerful, reliable and versatile SEM offering a high degree of resolution, excellent image quality and a wide range of features. With its extensive range of imaging options, it provides a great platform for advanced research, industrial and educational applications.
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