Used JEOL JSM 6500F #9180119 for sale

JEOL JSM 6500F is a type of scanning electron microscope (SEM) that is used to observe a range of samples at the nanoscale. It offers superior resolution imaging, elemental and chemical analysis of samples, as well as a range of features for both high- and low-magnification imaging. JEOL JSM-6500 F operates in both variable pressure (VP) and high vacuum (HV) modes, making it a versatile instrument for both low- and high-resolution imaging. Its VP feature allows for a monitoring of specimen surface in low vacuum and eliminates the need for a cryo-pumping system, thus improving sample preparation. It also comes equipped with an environmental noise filter that reduces non-scientific signals, giving users a clearer overview of the sample topography. In imaging mode, JSM 6500F can magnify up to 200,000x, offering precise details of a sample's structure. It also facilitates detection of surface features at low magnifications, enabling the user to identify any abnormalities. Along with imaging capabilities, the microscope is outfitted with specific detectors that can perform chemical or elemental analysis of a sample using secondary electrons, backscatter electrons, and x-rays. JSM-6500 F also comes with a range of signal stabilization features such as low-noise circuitry for optimal resolution and signal-to-noise ratio, as well as a multi-channel amplifier for sample surface measurements. In addition, the scope employs an automated image optimization technology that allows it to precisely optimize image contrast for different samples. This SEM is also equipped with a gas injector module to provide a gentle flow of inert gas such as argon or nitrogen to the sample for better resolution. Its in-lens secondary electron detector also allows for improved imaging results and high lateral resolution. For operational convenience, JEOL JSM 6500F is operated via a computer controlled GUI. Its touchscreen interface can be used to adjust setup parameters such as electron beam current, accelerating voltage, and focus. It also includes a range of image adjustment tools such as brightness, contrast, sharpness, and saturation, allowing users to customize images to their needs. This scanning electron microscope is a versatile and reliable instrument for the observation and analysis of fluorescent materials, polymers, and biological samples. With its superior resolution, advanced imaging technology, and convenient touchscreen interface, JEOL JSM-6500 F is an ideal instrument for various laboratory applications.