Used JEOL JSM 6510 #293601626 for sale

JEOL JSM 6510 is a Scanning Electron Microscope (SEM) designed for high-resolution imaging and analysis. JSM 6510 utilizes a high-performance electron column for a both quality imaging and higher accelerating voltage (up to 100kV). This high-power, cold-field emission gun (FEG) with a small spot size, wide working distance range, and low electron beam divergence, allows for precise imaging and measurements. JEOL JSM 6510 also features a three-dimensional in-lens secondary electron detector which minimizes the risk of signal noise due to the emission of stray electrons. Furthermore, the 6510 has an optional in-lens backscattered electron detector which allows for the creation of dual detector image to analyse topography and chemical composition in a single acquisition. The 6510 also boasts an array of user-friendly features to facilitate the most efficient workflow. For example, the motor driven stage for large samples allows a quick and accurate stage-positioning for both imaging and automated sample analysis. The Scanning Transmission Electron Microscopy (STEM) capability compatible with JSM 6510 allows for high resolution Z-contrast imaging and elemental mapping. Moreover, the high-contrast bright field imaging mode facilitates high-bilateral-accuracy observation of crystallographic planes and the specimen's microstructures. Overall, JEOL JSM 6510 facilitates a simple and precise analytical platform for advanced imaging and analysis. This includes high-resolution imaging and engineering analysis, chemical analysis, and material characterization. Furthermore, the 6510's 'Gallium' Scan Function allows for a 'Chromatic Aberration Correction' with computer-aided image-processing capabilities, making it an ideal choice for detailed observation, as well as quantitative nano-analysis.