Used JEOL JSM 6510 #293656752 for sale

JEOL JSM 6510
ID: 293656752
Wafer Size: 8"
Scanning Electron Microscope (SEM), 8".
JEOL JSM 6510 is an advanced scanning electron microscope (SEM) designed to provide ultra-high resolution imaging and analysis of a wide range of specimens. The equipment features a wide range of capabilities from low-pressure imaging to bulk elemental analysis. JSM 6510 employs a single large-area field emission electron source, capable of producing beams below 0.2 nanometers (nm) wide. This small beam diameter allows ultra-high magnification imaging and analysis, capable of resolving features as small as 0.4 nm. The high vacuum chamber prevents interference from air molecules, providing sharp, clear images with minimal distortion. JEOL JSM 6510 has a wide range of detectors for measuring secondary or back scattered electrons (BSE), secondary electrons (SE), reflected charge, and transmitted electrons (TE). The BSE detector is highly sensitive and effective at producing high-quality imaging, while the SE detector is more sensitive to surface features and fine structure. The reflected charge and TE detectors can be used for non-destructive elemental mapping. JSM 6510 is equipped with a comprehensive suite of software and hardware to control the beam, manage the image data, and make complex modifications to acquire images at the highest possible resolution. The automated image generation and analysis capabilities of the software, coupled with the flexible hardware controls, make the system easy and intuitive to learn and operate. The JSM also includes an automatic specimen changer, which allows quick and easy inspection of multiple specimens. This helps maximize workflow and throughput. Additionally, the unit can be operated in a variety of environments, from low-vacuum imaging to high-pressure imaging. The control machine is inherently safe, with a fail-safe design to ensure maximum safety for researchers. Overall, JEOL JSM 6510 is a powerful and versatile SEM, designed to provide high-resolution imaging and analysis across a wide range of environments and sample types. Its comprehensive suite of software and hardware management tools make it easy to use and highly efficient, ideal for any research laboratory.
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