Used JEOL JSM 6510 #293716178 for sale

JEOL JSM 6510 is a scanning electron microscope (SEM) used for a wide range of applications for imaging and analysis. It features the latest in technological advancements, providing users with advanced capability and superior image quality. JSM 6510 is equipped with an Everhart-Thornley type detector equipment and provides a high resolution and depth of field. This allows users to observe both surface and subsurface structures of very thin materials without the need to increase the accelerating voltages. The microscope is also built with an in-lens detector system that enables the examination of submicron structures without the need for extra vacuum unit. JEOL JSM 6510 is designed to be easy to operate, and provides users with an intuitive touch screen control interface. It is also equipped with an auto-Z motor that offers a scanning speed of up to 30 frames per second, enabling users to capture dynamic images in real-time. In addition, the microscope also features a Magnification Modulator (M2) which can increase the magnification from 1x to 400x with a single turn of the control wheel. In order to ensure accurate results, JSM 6510 is built with two sample stages for variable angle and variable speed scanning. The sample stage can handle samples up to 8 mm in diameter, and is also compatible with a wide range of accessories including stage heating systems, electron beams to observe sub-micron structures, and optical systems. The microscope also provides a wide range of capabilities, including surface chemical analysis, 3D imaging, elemental mapping, accelerated beam machine and superior resolution imaging. Additionally, its compatibility with a variety of automated measurements software allows users to quickly and easily obtain accurate results. JEOL JSM 6510 is the perfect choice for a variety of SEM applications. From materials sciences to electron microscopy, JSM 6510 delivers amazing performance and superior image quality.