Used JEOL JSM 6510 #9184193 for sale
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ID: 9184193
Vintage: 2012
Scanning electron microscope (SEM)
Tungsten filament
Includes:
Standard recipe
Stigmator memory
Dual live image
Full size image display
Pseudo color
Digital zoom
Dual magnification
Measurement
Auto image archiving
JED-2300 EDS (JSM-6510LA and JSM-6510A)
Resolution HV mode: 3.0 nm (30 kV), 8nm (3 kV), 15 nm (1 kV)
LV Mode: 4.0 nm (30 kV) (JSM-6510LA and JSM-6510LV)
Magnification: 5 x 300,000 (on 128 mm x 96 mm image size)
Preset magnifications: (5) Steps
Custom recipe:
Operation conditions:
Optics
Image mode
LV Pressure
Image mode:
Secondary electron image
REF Image
Composition (JSM-6510LA and JSM-6510LV)
Topography (JSM-6510LA and JSM-6510LV)
Shadowed (JSM-6510LA and JSM-6510LV)
Accelerating voltage: 0.5 kV to 30 kV
Filament: Factory pre-centered filament
Electron gun: Automated, manual override
Condenser lens: Zoom condenser lens
Objective lens: Super conical objective lens
Objective lens apertures: (3) Stages, XY fine adjustable
Electrical image shift: ± 50 μm (WD = 10 mm)
Auto functions: Focus, brightness, contrast, stigmator
Eucentric large-specimen stage:
X: 80 mm
Y: 40 mm
Z: 5 mm to 48 mm
Tilt: −10° to 90°
Rotation: 360°
Reference image (navigator): (4) Images
Maximum specimen: 150 mm diameter
PC: IBM PC/AT Compatible
OS: Windows 7
Monitor: 19" LCD
Frame store: 640 x 480, 1280 x 960, 2560 x 1920, 5120 x 3340
Multi image display:
(2) Images
(4) Images
Network: Ethernet
Image format: BMP, TIFF, JPEG
Fully automated pumping system:
DP1(Diffusion pump)
RP1(Dough pump)
2012 vintage.
JEOL JSM 6510 is a scanning electron microscope (SEM) designed for both high-resolution characterization and imaging. It is equipped with the latest, field-proven technology to provide high-quality imaging and increased throughput. With large field of view (FOV) and enhanced depth of field (DOF), JSM 6510 is capable of resolving the fine structures in samples. JEOL JSM 6510 has superior imaging capability and enhanced signal-to-noise ratio thanks to its state-of-the-art column. It is equipped with a flat-field lens for uniform and high-definition imaging, creating images at high resolution, high contrast, and high spatial resolution. Its secondary electron detector (SED) is equipped with a high-sensitivity lower voltage detector and energy spectrum imaging capabilities, allowing users to perform analytical tasks with improved accuracy. JSM 6510 offers flexibility through multiple acceleration voltage, electron detection, and imaging, making it applicable to a range of samples and analytical tasks. Additionally, it is equipped with an automated sample mount system and automatic detection of samples for accurate and repeatable results. JEOL JSM 6510 provides a variety of additional features such as tilt stereoscopy, tomography, inspection, and 3D imaging to provide a comprehensive overview of the sample. Additionally, JSM 6510 uses an in-column rastering stage, allowing users to refine their images by selecting their preferred imaging area and parameters such as tilt, resolution, etc. JEOL JSM 6510 is also designed with an open software platform, providing users with the flexibility to customize their imaging procedure and add additional capabilities such as automated routines. JSM 6510 is an ideal tool for a wide range of characterization and imaging tasks, including biological, environmental, materials, and other analytical applications. With its combination of advanced imaging capabilities and user-friendly features, JEOL JSM 6510 can provide superior imaging performance.
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