Used JEOL JSM 6510 #9197947 for sale
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ID: 9197947
Scanning electron microscope (SEM)
With OXFORD Inca EDS
Resolution HV mode: 3.0 nm (30 kV), 8 nm (3 kV), 15 nm (1 kV)
LV Mode: 4.0 nm (30 kV)
Magnification: x 5 to x 300,000 (on 128 mm x 96 mm image size)
5-Step preset magnification
Standard recipe
Custom recipe:
Operation conditions:
Optics
LV Pressure
Specimen stage
Image mode:
Secondary electron image
REF Image
Composition
Topography
Shadowed
Filament: Factory pre-centered filament
Electron gun: Fully automated, manual override
Condenser lens: Zoom condenser lens
Objective lens: Super conical objective lens
Objective lens apertures: (3) Stages, XY fine adjustable
Stigmator memory
Electrical image: Shift ± 50 μm (WD = 10 mm)
Auto functions:
Focus
brightness
contrast
stigmator
Specimen stage: Eucentric large-specimen stage
X: 80 mm, Y: 40 mm, Z: 5 mm to 48 mm,
Tilt: −10° to 90°
Rotation: 360°
Specimen exchange: Draw out the stage
Maximum specimen: 150 mm Diameter
PC: IBM PC/AT Compatible
Operating system: Windows 7
Monitor: 19" LCD, 1 or 2*2
Frame store: 640 x 480, 1,280 x 960, 2,560 x 1,920, 5,120 x 3,340
Dual live image
Full size image display
Pseudo color
Multi image display: (2) Images, (4) Images
Digital zoom
Dual magnification
Network: Ethernet
Measurement
Image format: BMP, TIFF, JPEG
Auto image archiving
Pumping system: Fully automated, DP: 1, RP: 1 or 2*1
Switching vacuum mode: Through the menu
LV Pressure: 10 to 270 Pa
JED-2300 EDS*2
Principal options:
Back scattered electron detector
Low vacuum secondary electron detector
Energy dispersive X-ray analyzer (EDS)
Wave length dispersive X-ray analyzer (WDS)
EBSD
Stage navigation system
Airlock chamber
Chamber scope
Operation keyboard
LaB6 Electron gun
Operation console: 750 mm wide, 900 mm wide
Motor controlled stage: 2 Axes, 3 Axes, 5 Axes
Accelerating voltage: 0.5 kV to 30 kV
Currently installed.
JEOL JSM 6510 is a high-resolution scanning electron microscope (SEM) designed for research and industrial applications. The instrument is equipped with a high-performance electron source for producing images with a resolution of 4.5 nanometres for both low- and high-voltage scans. It also includes both inverse and bright field detectors to capture secondary and back scattered electrons enabling the production of high-resolution 3D images. JSM 6510 is capable of a wide variety of on-board imaging techniques, including two- and three-dimensional image processing, analysis of crystal structures, line profile scans, mapping of surface topographies, and compositional identification. In addition, the user can set up a wide range of operations and parameters to customize the equipment's performance to their specific application. The specimen stage is capable of continuous fine rotation of 0.002° and also enables automatic wide-field mosaics, automatic drift correction, and automated point-and-click alignment. With a standard working distance of 10 mm, the stage has a full range of motion with over a millimeter of displacement in three orthogonal directions. JEOL JSM 6510 is designed for efficient user operation. The instrument is built with an ergonomic user interface and includes a 19 inch color display. An on-board computer also supports a variety of networking protocols, including USB and Ethernet, for communication with PCs. JSM 6510 has a sophisticated imaging equipment that includes a low energy SEM column, a microfocusing system, and adjustable contrast and brightness balance. It also comes with an energy filtering unit and an energy-dispersive X-ray analysis machine, allowing the user to study composition, conduct qualitative phase analysis, and map element distribution in the sample. Overall, JEOL JSM 6510 is an advanced, high-performance SEM that is capable of producing excellent image quality for a variety of applications. It is designed for efficient use by experienced researchers and can be adapted to meet the needs of industrial sample characterization.
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