Used JEOL JSM 6510 #9263314 for sale

JEOL JSM 6510 is a scanning electron microscope with an additional environmental chamber option. It is ideal for studying biological and environmental materials. This high performance SEM has a unique combination of features that provide the highest level of sample flexibility and quality imaging with a wide range of samples. JSM 6510 is capable of providing 0.2nm resolution and advanced analytical capabilities, providing excellent imaging and analysis for many samples. The small, compact system enables users to easily transport samples and observe them in situ. A built-in stage holder accommodates samples up to 200mm in diameter, and up to 10mm in height. The SEM's advanced imaging capabilities include an environmental chamber option that provides controlled conditions for imaging and analysis. The environmental chamber is configurable to either vacuum or gas, allowing for observations of samples in a native environment or interaction between the sample and a controlled ambient environment. The high-resolution imaging and analysis capabilities of JEOL JSM 6510 are enhanced by its SE, BSE, and EDX detectors. These detectors enable a wide range of imaging and analysis modes including polarization, emission detection, backscatter electron imaging, and energy dispersive spectroscopy. Additionally, the detectors' position can be adjusted to ensure optimal imaging for challenging samples. The operating and imaging speed of JSM 6510 is driven by two CO-XE4 detectors, providing fast dynamic imaging with improved accuracy and resolution. Dual, quad, mono and stereo imaging modes are also available, allowing for a range of imaging applications. Advanced features of JEOL JSM 6510 include automated image processing, off-axis imaging, and video recording for in-depth study and image comparison. The integrated features are integrated with a user-friendly interface, allowing users to quickly and easily operate and optimize the imaging conditions. The integrated stand on the SEM enables users to quickly adjust the microscope in a vertical or horizontal position for optimized imaging. JSM 6510 scanning electron microscope is a powerful tool for advanced imaging and analysis of biological and environmental samples. It boasts a wide range of features, providing users with improved accuracy and speed for their studies.