Used JEOL JSM 6510LA #293607337 for sale

JEOL JSM 6510LA is a scanning electron microscope (SEM) capable of providing high-resolution imaging and analysis. This type of device is widely used in fields such as material science, metallography, and electronics to provide surface and subsurface information on samples. JSM 6510LA is equipped with a wide range of features that allow it to produce precise and detailed images of a wide range of materials. This includes a Schottky electron source that is capable of generating a very small electron spot size, resulting in high resolution images. Additionally, the SEM is also equipped with an in-lens secondary electron detector that is capable of observing three-dimensional surface morphology of a sample and displaying it directly on the monitor. JEOL JSM 6510LA is equipped with a range of automated features that make it easy to operate and perform analysis without extensive user input. These features include an automated image stitching system, an automated specimen alignment system, an automated backscatter electron detector, and an automated image scaling system. These features enable users to quickly and accurately analyze images without needing to manually enter coordinates or monitor sample orientations. In addition to the automated features, JSM 6510LA is also equipped with a range of manual controls that enable users to adjust the electron beam gun setting. This includes settings for the acceleration voltage, spot size, brightness, and astigmatism, among others. The manual controls enable the user to precisely control the parameters of the electron beam to produce images that are tailored to their specific requirements. JEOL JSM 6510LA is equipped with a number of analytical capabilities, including SEM-based x-ray dispersive spectroscopy (XEDS), electron backscatter diffraction (EBSD), and energy dispersive X-ray analysis (EDAX). These analytical techniques allow users to gain insights into the structural and chemical make-up of a given sample, enabling more informed decisions to be made. JSM 6510LA is a reliable and powerful scanning electron microscope that is capable of producing detailed and accurate images of a wide range of materials. Powered by the combination of automated features and manual controls, this SEM facilitates accurate analysis of surface and subsurface features of a sample, making it a valuable tool in many scientific and industrial applications.