Used JEOL JSM 6510LA #293632286 for sale

JEOL JSM 6510LA is a scanning electron microscope (SEM) suitable for a wide range of applications including imaging, trace element analysis and failure analysis. This SEM is equipped with a high-performance field emission electron gun for high-resolution imaging and High Vacuum/Low Vacuum capability for vacuum requirements as low as 2 Pa. The minimum accelerating voltage is 1kV allowing for efficient sample imaging in a low-energy environment. JSM 6510LA has a robust stage with ± 35mm of X, Y, and Z travel for easy access to large die surfaces and challenging samples. The five-axis micropositioner enables precise alignment and movement of the sample, allowing for full access and imaging of the entire component. JEOL JSM 6510LA is equipped with a high-speed digital image converter that enables low-noise imaging with a wide dynamic range. This SEM allows for the imaging of features with a size down to 2nm in thickness, enabling unparalleled accuracy and detail. Furthermore, multi-image stitching capabilities are also included for creating seamless, panoramic views of objects. JSM 6510LA includes a comprehensive software package for automated operation and processing including Stereo Imaging and Real-Time X-Ray Imaging. This software simplifies the imaging process, maximizing throughput and ease-of-use. Integrated EDX (Energy Dispersive X-ray Spectroscopy) with very good spatial resolution is included for rapid elemental analysis of the sample. Finally, JEOL JSM 6510LA is designed for high-throughput and low maintenance. The chamber construction and electron optics are designed for long periods of continuous operation and excellent stability. Together with the intuitive and easy-to-use user interface, this SEM provides superior functionality and superior performance.